深圳创新峰达科技有限公司ShenZhen New Acme Technology CO.,LTD
红外模拟相机 CONTOUR-IR
  • 红外模拟相机 CONTOUR-IR

产品描述

                                                      IR CAMERA

The near infrared IR camera is designed for viewing, registration and records radiation emitted by infrared sources such as GaAs IR LED s, diode- or solid-state lasers as well as for use in infrared microscopy, infrared luminescence, examine documents, forensics, art restoration and etc. The camera is based on a high-sensitive low-noise silicon CCD sensor with the increased near infrared sensitivity.

 

                                                   SPECIFICATIONS

 

Spectral sensitivity                       400…1700 nm

Sensor size                                  1/3 inches,6.0 mmx4.96 mm

Max. resolution                             570 TV lines

Resolution at max. sensitivity       135 TV lines

Lens                                             F1.4/26mm, CS-mount

Field of view                                 10 deg.

Focusing range                            20 cm to inf. (8 cm to inf. with the distance ring)

Ratio signal-to-noise                    48 Db

Gamma                                        0.45                                     

Video output                                 CCIR Standard composite video                                                       

Power supply                                DC 10…14V, 150mA

Temperature range                      278-333K

Weight                                          0.23kg

Dimensions                                  (50x58x90) mm

Temperatures range                    +5…+40 deg.C

 

Set includes: IR camera, distance ring, IR cut-off filter, manual, case.

The approximate minimal power density of radiation on an object at the signal-to-noise ratio =10 (20dB) on a distance 10 cm:

300-500μW/cm2 at   1310nm

20-30mW/cm2    at   1550nm

80-100mW/cm2  at   1700nm

 

The silicon sensor has high sensitivity in the near-infrared spectrum and at sufficient density of radiation power  and thanks to two-photon absorption in silicon can be used for visualization of infrared radiation with wavelength up to 1700 nanometers. However thus the response of a sensor has square-law character and is of little use for carrying out of measurements. Camera has four-stage system of automatic gain. Exposition time depends from a level of light exposure within the range from 10 μs up to 20 ms. At low light exposure, i.e. at the maximal sensitivity of the camera time of an exposition makes 20 ms. The sensitivity of the camera is increased automatically because of addition of pixels. But the resolution of the camera is decreased.

The camera has the maximal sensitivity at the lowered external illumination,  when there are no the external light hindrances decreasing the picture contrast and when the mode of the increased sensitivity of the camera automatically is switched on.


http://www.innofonda.net

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